HarshComp             package:Harshlight             R Documentation

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_D_e_s_c_r_i_p_t_i_o_n:

     Harshlight automatically detects and masks blemishes in microarray
     chips of class 'AffyBatch'

_U_s_a_g_e:

     HarshComp(affy.object, my.ErrorImage = NULL, extended.radius = 10,
     compact.quant.bright = 0.025, compact.quant.dark = 0.025,
     compact.size.limit = 15, compact.connect = 8, compact.pval = 0.01,
     percent.contiguity = 50, report.name = 'R.report.ps',
     na.sub = FALSE, interpolate = TRUE)

_A_r_g_u_m_e_n_t_s:

affy.object: An AffyBatch object containing two or more chips.

my.ErrorImage: A batch of ErrorImages obtained through other programs.
          The error images must be in a matrix format, in which the
          first index represents each cell in the matrix and the second
          index represents the chip number. By default, the program
          calculates the error images for the batch of chips
          affy.object as described in Suarez-Farinas M et al., BMC
          Bioinformatics - 2005. If a batch of error images is
          provided, the affy.object is also required.

extended.radius: Radius of the median kernel used to identify extended
          defects on the chip.

compact.quant.bright, compact.quant.dark: Quantiles of the Error Image
          used to declare outliers. Values bigger than the '(1 -
          compact.quant.bright)' percentile are bright outliers, while
          values smaller than the 'compact.quant.dark' percentile are
          dark outliers. The two quantiles are used to detect compact
          defects. Set it to 0 to turn compact defect detection off.

compact.size.limit: Minimum size for clusters to be considered defects.
          If 0, all the clusters identified will be considered defects,
          if their size is significantly bigger than the one expected
          by chance (see also compact.pval).

compact.connect: Defines the neighbourhood of a pixel, used to connect
          outliers into clusters. If 4, the neighbourhood contains the
          pixels that are adjacent of a pixel of reference, on the
          vertical or horizontal axis. If 8, the neighbourhood contains
          all the 8 pixels sorrounding the pixel of reference. If a
          connectivity of 4 is used, clusters that are connected only
          through an edge will be considered as separate clusters. In
          this case, the single clusters could be eliminated because
          their size does not exceed compact.size.limit or
          diffuse.size.limit. Therefore, we suggest to use a
          connectivity of 8.

compact.pval: Threshold for compact defect size. This is the maximum
          probability accepted to find a cluster of the same size by
          chance. If 1, a cluster is considered a compact defect if it
          is bigger than the value of compact.size.limit.

percent.contiguity: Minimum percentage of area density for defects to
          be considered compact. If 0, every compact defect found will
          be eliminated before searching for diffuse defects. Though
          possible, avoid using less than 20; otherwise diffuse defects
          might not be identified properly.

report.name: Name of the PostScript file in which to save the final
          report. If report.name is set to "", no report will be
          written.

  na.sub: If TRUE, the intensity values of the input affyBatch that are
          affected by defects will be changed in NA. If FALSE, the
          values will be substituted with the median of the intensity
          values of the other chips.

interpolate: This option is only used if the value of
          compact.quant.bright or compact.quant.dark is not among those
          tabulated (density of outliers = 0.01, 0.02, 0.05, 0.10,
          0.20, 0.25, 0.30, 0.40; chip size = 534x534, 640x640,
          712x712). If TRUE, the cluster size distribution under the
          null hypothesis of spatially randomly distributed outliers is
          derived from simulated values through interpolation. If
          FALSE, the distribution is simulated for the input value of
          density of outliers (compact.quant.bright/compact.quant.dark)
          and the specific chip size. The program runs 100.000
          simulations by default.

_V_a_l_u_e:

     HarshComp is used to detect extended and compact defects only. 

AffyBatch object: The input AffyBatch object, whose intensity values
          corresponding to defected areas are substituted either by NA
          or by the median of the chip's values (depending on na.sub).

  Report: For each AffyBatch analyzed, a report is written as a
          PostScript file (see also report.name).

_A_u_t_h_o_r(_s):

     Mayte Suarez-Farinas, Maurizio Pellegrino, Knut M. Wittkwosky,
     Marcelo O. Magnasco mpellegri@rockefeller.edu

_R_e_f_e_r_e_n_c_e_s:

     <URL: http://asterion.rockefeller.edu/Harshlight/>

     Harshlight: a "corrective make-up" program for microarray chips,
     Mayte Suarez-Farinas, Maurizio Pellegrino, Knut M Wittkowski and
     Marcelo O Magnasco, BMC Bioinformatics 2005 Dec 10; 6(1):294

     "Harshlighting" small blemishes on microarrays, Suarez-Farinas M,
     Haider A, Wittkowski KM., BMC Bioinformatics. 2005 Mar 22;6(1):65.

